This book is a basic introduction in the field of nanoscale measurements offerroelectric materials using scanning probe microscopy. It address imagingmechanism and quantitative analysis in the piezoelectric scanning probe microscopy as well as basic physics at nanoscale level in ferroelectrics such as nanoscale switching, scaling effects, and transport mechanisms. This state-of-the art review of theory and experiments will be a useful reference for advances readers such as researchers and as well for newcomers or graduate students. The non-specialist is informed about different approaches, while the researcher in ferroelectric field is provided with details of scanning probe-microscopy-based measurements of ferroelectrics.

ISBN 3-540-20662-0